CD uniformity control via real-time control of photoresist properties
10.1117/12.771418
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Main Authors: | Chen, M., Fu, J., Ho, W.K., Tay, A. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/69571 |
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Institution: | National University of Singapore |
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