Circuit model of elastomer probe for fine pitch wafer level package test applications
Proceedings of 7th Electronics Packaging Technology Conference, EPTC 2005
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Main Authors: | Jayabalan, J., Ooi, B.L., Leong, M.S., Iyer, M.K. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/69603 |
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Institution: | National University of Singapore |
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