On the performance limit of impact-ionization transistors

On the performance limit of impact-ionization transistors

10.1109/IEDM.2007.4418878

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Bibliographic Details
Main Authors:	Shen, C., Lin, J.-Q., Toh, E.-H., Chang, K.-F., Bait, P., Heng, C.-H., Samudra, G.S., Yeo, Y.-C.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/71238
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Institution:	National University of Singapore

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