Real-time spatial control of steady-state wafer temperature during thermal processing in microlithography
10.1117/12.654741
Saved in:
Main Authors: | Tay, A., Ho, W.-K., Hu, N., Tsai, K.-Y., Zhou, Y. |
---|---|
Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
|
Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/71572 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
An in situ approach to real-time spatial control of steady-state wafer temperature during thermal processing in microlithography
by: Tay, A., et al.
Published: (2014) -
Fault detection and estimation of wafer warpage profile during thermal processing in microlithography
by: Tay, A., et al.
Published: (2014) -
In-situ measurement & control of photoresist development in microlithography
by: Kiew, C.M., et al.
Published: (2014) -
In-situ measurement & control of photoresist development in microlithography
by: Kiew, C.M., et al.
Published: (2014) -
In-situ measurement and control for photoresist processing in microlithography
by: Tay, A., et al.
Published: (2014)