Compliance, deformation and thermal fatigue behavior of multi-copper-column interconnects
Proceedings of 7th Electronics Packaging Technology Conference, EPTC 2005
Saved in:
Main Authors: | Liao, E.B., Tay, A.A.O., Ang, S.S.T., Feng, H.H., Nagarajan, R., Kripesh, V., Kumar, R., Mahadevan, I. |
---|---|
Other Authors: | MECHANICAL ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/73265 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Effects of wetting angle and loading direction on fatigue behavior of multi-copper column flip-chip interconnects
by: Liao, E.B., et al.
Published: (2014) -
Numerical analysis on compliance and electrical behavior of multi-copper-column flip-chip interconnects for wafer-level packaging
by: Liao, E.B., et al.
Published: (2014) -
Fatigue and bridging study of high-aspect-ratio multicopper-column flip-chip interconnects through solder joint shape modeling
by: Liao, E.B., et al.
Published: (2014) -
Fabrication and parametric study of wafer-level multiple-copper-column interconnect
by: Liao, E.B., et al.
Published: (2014) -
Optimization of reliability of wafer level copper column interconnections using a variable compliance interconnect design
by: Tay, A.A.O., et al.
Published: (2014)