Investigation of Performance Limits of Germanium Double-Gated MOSFETs
Technical Digest - International Electron Devices Meeting
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Main Authors: | Low, T., Hou, Y.T., Li, M.F., Zhu, C., Chin, A., Samudra, G., Chan, L., Kwong, D.-L. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/81497 |
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Institution: | National University of Singapore |
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