Investigation of quasi-breakdown mechanism through post-quasi-breakdown thermal annealing

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Saved in:
Bibliographic Details
Main Authors: Loh, W.Y., Cho, B.J., Li, M.F.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82578
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore

Similar Items