Self-consistent simulation of quantum dot flash memory device with SiO 2 and HfO 2 dielectrics
10.1142/S0219581X05003036
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Main Authors: | Chong, C.C., Zhou, K.H., Bai, P., Li, Er.P., Samudra, G.S. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/83006 |
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Institution: | National University of Singapore |
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