Experimental characterization of the reliability of multi-terminal dual-damascene copper interconnect trees
Materials Research Society Symposium - Proceedings
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Main Authors: | Gan, C.L., Thompson, C.V., Pey, K.L., Choi, W.K., Chang, C.W., Guo, Q. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/83713 |
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Institution: | National University of Singapore |
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