In-situ measurement & control of photoresist development in microlithography
10.1109/IMTC.2004.1351183
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Main Authors: | Kiew, C.M., Tay, A., Ho, W.K., Lim, K.W., Zhou, Y. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/83845 |
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Institution: | National University of Singapore |
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