Strained In0.53Ga0.47As n-MOSFETs: Performance boost with in-situ doped lattice-mismatched source/drain stressors and interface engineering
Digest of Technical Papers - Symposium on VLSI Technology
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Main Authors: | Chin, H.-C., Xiao, G., Xinke, L., Zhe, L., Yeo, Y.-C. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/84232 |
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Institution: | National University of Singapore |
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