Monolithic integration of Si-CMOS and III-V-on-Si through direct wafer bonding process
Integration of silicon-complementary metal oxide-semiconductor (Si-CMOS) and III-V compound semiconductors (with device structures of either InGaAs HEMT, AlGaInP LED, GaN HEMT, or InGaN LED) on a common Si substrate is demonstrated. The Si-CMOS layer is temporarily bonded on a Si handle wafer. Anoth...
Saved in:
Main Authors: | Lee, Kwang Hong, Wang, Yue, Wang, Bing, Zhang, Li, Sasangka, Wardhana Aji, Goh, Shuh Chin, Bao, Shuyu, Lee, Kenneth E., Fitzgerald, Eugene A., Tan, Chuan Seng |
---|---|
Other Authors: | School of Electrical and Electronic Engineering |
Format: | Article |
Language: | English |
Published: |
2018
|
Subjects: | |
Online Access: | https://hdl.handle.net/10356/86269 http://hdl.handle.net/10220/45258 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |
Similar Items
-
Adhesive wafer-to-wafer bonding using contact imprinting
by: Yu, L., et al.
Published: (2014) -
Adhesive bonding with SU-8 at wafer level for microfluidic devices
by: Yu, L., et al.
Published: (2014) -
Characterization of intermediate In/Ag layers of low temperature fluxless solder based wafer bonding for MEMS packaging
by: Lee, C., et al.
Published: (2014) -
Wafer level packaging of pressure sensor using SU8 photoresist
by: Iliescu, C., et al.
Published: (2014) -
Wafer-level hermetic bonding using Sn/In and Cu/Ti/Au metallization
by: Yu, D.-Q., et al.
Published: (2014)