Impact of interfacial layer control using Gd2 O3 in Hf O2 gate dielectric on GaAs
10.1063/1.2732821
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Main Authors: | Dalapati, G.K., Tong, Y., Loh, W.Y., Mun, H.K., Cho, B.J. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/56265 |
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Institution: | National University of Singapore |
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