Evidence for a composite interface state generation mode in the CHE-stressed deep-submicrometer n-MOSFET
10.1109/TED.2004.838447
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Main Authors: | Ang, D.S., Liao, H., Phua, T.W.H., Ling, C.H. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/82304 |
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Institution: | National University of Singapore |
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