Characterization and modeling of on-wafer interconnects for RFICs

This thesis addresses the characterization and modeling of on-wafer interconnects for CMOS RFICs. A scalable equivalent circuit model for complex-shaped interconnects is proposed. In this proposed structure, frequency-variant characteristics are modeled by frequency independent components. Therefore...

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Bibliographic Details
Main Author: Shi, Xiaomeng
Other Authors: Yeo Kiat Seng
Format: Theses and Dissertations
Published: 2008
Subjects:
Online Access:https://hdl.handle.net/10356/3506
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Institution: Nanyang Technological University

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