Effects of rapid thermal annealing on structural, magnetic and optical properties of Ni-doped ZnO thin films

• Main Authors: Zhao, Xing, Liu, Erjia, Ramanujan, Raju Vijayaraghavan, Chen, Jingsheng
• Other Authors: School of Materials Science & Engineering
• Format: Article
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films
• Online Access: https://hdl.handle.net/10356/95971; http://hdl.handle.net/10220/10831
• Institution: Nanyang Technological University

XPS depth profiles were used to investigate the effects of rapid thermal annealing under varying conditions on the structural, magnetic and optical properties of Ni-doped ZnO thin films. Oxidization of metallic Ni from its metallic state to two-valence oxidation state occurred in the film annealed i...