Direct tunneling currents through gate dielectrics in deep submicron MOSFETs
Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors
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Main Authors: | Hou, Y., Li, M., Jin, Y. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/55657 |
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Institution: | National University of Singapore |
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