Interface configuration and Fermi-level pinning of fully silicided gate and high-K dielectric stack
10.1116/1.2198849
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Main Authors: | Joo, M.S., Park, C.S., Cho, B.J., Balasubramanian, N., Kwong, D.-L. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/56367 |
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Institution: | National University of Singapore |
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