Comprehensive studies of BTI effects in CMOSFETs with SiON by new measurement techniques

• Main Authors: Liu, Z.Y., Huang, D., Liu, W.J., Liao, C.C., Zhang, L.F., Gan, Z.H., Wong, W., Li, M.-F.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/69676
• Institution: National University of Singapore

10.1109/RELPHY.2008.4559012