Contact resistance reduction technology using selenium egregation for N-MOSFETs with silicon-carbon source/drain
10.1109/TED.2009.2016143
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Main Authors: | Wong, H.-S., Ang, K.-W., Chan, L., Samudra, G., Yeo, Y.-C. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/82087 |
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Institution: | National University of Singapore |
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