Schottky-barrier si nanowire mosfet: Effects of source/drain metals and gate dielectrics

Schottky-barrier si nanowire mosfet: Effects of source/drain metals and gate dielectrics

Materials Research Society Symposium Proceedings

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Bibliographic Details
Main Authors:	Yang, W., Whang, S., Lee, S., Zhu, H., Gu, H., Cho, B.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/84161
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Institution:	National University of Singapore

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