Fast DNBTI components in p-MOSFET with SiON dielectric

Fast DNBTI components in p-MOSFET with SiON dielectric

10.1109/LED.2005.857684

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Bibliographic Details
Main Authors:	Yang, T., Shen, C., Li, M.F., Ang, C.H., Zhu, C.X., Yeo, Y.-C., Samudra, G., Rustagi, S.C., Yu, M.B., Kwong, D.-L.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Subjects:	Dynamic negative biased temperature instability (DNBTI) MOSFETs SiON
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/82346
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Institution:	National University of Singapore

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