Formation of polycrystalline silicon germanium/HfO2 gate stack structure using inductively coupled plasma etching
10.1116/1.1586283
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Main Authors: | Chen, J., Tan, K.M., Wu, N., Yoo, W.J., Chan, D.S.H. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/82377 |
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Institution: | National University of Singapore |
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