Interface-engineered high-mobility high-κ/Ge pMOSFETs with 1-nm equivalent oxide thickness
10.1109/TED.2009.2019420
Saved in:
Main Authors: | Xie, R., Phung, T.H., He, W., Yu, M., Zhu, C. |
---|---|
Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
|
Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/82559 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Effective surface passivation by novel SiH4-NH3 treatment and BTI characteristics on interface-engineered high-mobility HfO 2-gated Ge pMOSFETs
by: Xie, R., et al.
Published: (2014) -
Germanium pMOSFETs With Schottky-barrier Germanide S/D, high-Κ gate dielectric and metal gate
by: Zhu, S., et al.
Published: (2014) -
Germanium pMOSFETs With Schottky-barrier Germanide S/D, high-Κ gate dielectric and metal gate
by: Zhu, S., et al.
Published: (2014) -
Characteristics of self-aligned gate-first Ge p- and n-channel MOSFETs using CVD HfO2 gate dielectric and Si surface passivation
by: Wu, N., et al.
Published: (2014) -
Gate-first germanium nMOSFET with CVD HfO2 gate dielectric and silicon surface passivation
by: Wu, N., et al.
Published: (2014)