A novel program-erasable high-κ AlN capacitor with memory function

A novel program-erasable high-κ AlN capacitor with memory function

Proceedings 2004 Non-Volatile Memory Technology Symposium, NVMTS 2004

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Bibliographic Details
Main Authors: Chin, A., Lai, C.H., Hung, B.F., Cheng, C.F., McAlister, S.P., Zhu, C., Li, M.-F., Kwong, D.-L.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Aln
Erase
High dielectric constant (high κ)
Memory
Program
Retention
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83404
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Institution: National University of Singapore

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