New observations on the correlation between hole-trapping transformation and SILC generation under NBTI stressing
New observations on the correlation between the recoverable-to-permanent transformation of hole trapping and the generation of stress-induced leakage current (SILC) under negative-bias temperature stressing are presented. Both effects are shown to exhibit very similar temperature dependence, activat...
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Main Authors: | Boo, Ann Ann, Tung, Zhi Yan, Ang, Diing Shenp |
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Other Authors: | School of Electrical and Electronic Engineering |
Format: | Article |
Language: | English |
Published: |
2018
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/86847 http://hdl.handle.net/10220/45200 |
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Institution: | Nanyang Technological University |
Language: | English |
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