Advanced MOSFETs using HfTaON/SiO2 gate dielectric and TaN metal gate with excellent performances for low standby power application
Technical Digest - International Electron Devices Meeting, IEDM
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Main Authors: | Yu, X., Zhu, C., Yu, M., Li, M.F., Chin, A., Tung, C.H., Gui, D., Kwong, D.-L. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/83445 |
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Institution: | National University of Singapore |
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